Binder Labortechnik Applikationen

Applications

Avoiding and Removing of undesired Surface Damages on FIB prepared Specimens

Dr. rer. nat. habil. Hans-Dietrich Bauer und Birgit Arnold, Institut für Festkörper- und Werkstoffforschung Dresden

For the FIB preparation of cross sections, usually a strip of the sample is fixed on a half-ring. Here, you see the interesting layer, to be investigated, on the substrate. With the 30 keV Ga ion beam … more

Now, in the following I deal with the „thinning damage“. (Again my 1st transparency)more


Hydrophilization of TEM grids with a TPS 316 plasma cleaner

SCIENCE SERVICES GMBH AND BINDER LABORTECHNIK, MUNICH
17.11.2015 … more